Optical constants of evaporated amorphous zinc arsenide (Zn3As2) via spectroscopic ellipsometry
نویسندگان
چکیده
منابع مشابه
Optical constants of methyl-pentaphenylsilole by spectroscopic ellipsometry
The optical properties of 1-methyl-1,2,3,4,5-pentaphenylsilole thin films grown on silicon substrate were investigated using spectroscopic ellipsometry ~SE!. Accurate refractive index n and extinction coefficient k, in the wavelength range of 250 to 800 nm, were determined. Sellmeier equations, amorphous semiconductor model, and a three-oscillator classical Lorentz model were used to fit the da...
متن کاملApplication of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.
This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
متن کاملDetermination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis
Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis" (1995). Using variable angle spectroscopic ellipsometry, optical constants for AlAs (1.4-5.0 eV) are presented which are simultaneously compatible with measured data from four different samples. The below-gap index values are compatible with published prism measured values. The secon...
متن کاملInP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry
InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry" (1995). Faculty Publications from the Department of Electrical and Computer Engineering. 59. Using variable-angle spectroscopic ellipsometry (VASE) InP optical constants for photon energies have been determined in the range from 0.75 to 5.0 eV, which includes the fundamental gap at 1.35 eV. Ab...
متن کاملOptical Monitoring of Thin-films Using Spectroscopic Ellipsometry
Spectroscopic Ellipsometry (SE) offers a precise technique for measuring thin film properties. Advanced SE instrumentation has been demonstrated as an excellent technique for monitoring the growth of optical films for sputtering applications. We have recently extended this technique for PVD E-gun evaporated films. In this paper we will show how an SE system was integrated into a standard optica...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optical Materials Express
سال: 2019
ISSN: 2159-3930
DOI: 10.1364/ome.9.004677